Hitachi

Electron Microscopy and Thermal Analysis

Advanced analysis systems for surface characterisation and the thermal behaviour of materials.

Electron microscopes
AFM atomic force microscope
TMA and DMA
DSC and TGA thermal analysis

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Rigaku XRF ve XRD Sistemleri
Rigaku

XRF and XRD Systems

Elemental composition and crystal structure analysis by X-ray fluorescence and diffraction.

Analytical Instruments Details →